BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency

Climate
Frequencies
Mechanical testing
Electronic equipment and components
Environmental testing
Vibration testing
Destructive testing
Integrated circuits
Semiconductor devices
Variable

Link: BS EN IEC 60749-12:2018 Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Source: BSI Standards