BS EN IEC 60749-13:2018 Semiconductor devices. Mechanical and climatic test methods Salt atmosphere

Destructive testing
Environmental testing
Salt-spray tests
Electronic equipment and components
Mechanical testing
Accelerated corrosion tests
Climate
Integrated circuits
Accelerated testing
Salts
Corrosion resistance
Semiconductor devices

Link: BS EN IEC 60749-13:2018 Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Source: BSI Standards