Posted on January 12, 2018January 16, 2018 by Pulse AssentIEC 62047-29:2017 Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature Link: IEC 62047-29:2017 Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature Source: BSI Standards Related Posts:Businesses to be given UK product marking flexibilityNew laws to introduce digital labelling for…Government launches campaign to help businesses…£102 million government backing for nuclear and…UKEF upgrades support for SMEs to boost global…